Date of Award
5-1-2011
Degree Name
Master of Science
Department
Electrical and Computer Engineering
First Advisor
Tragoudas, Spyros
Abstract
This thesis targets the problem of critical path identification in sub-micron devices. Delays are described using Probability density functions (Pdfs) in order to model the probabilistic nature of the problem. Thus, a deterministic critical path response is not possible. The probability that each path is critical is reported instead. Extensive literature review has being done and presented in detail. Heuristics for accurate critical path calculations are described and results are compared to those from Monte Carlo simulations.
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