Co2MnSi thin films were grown on Al2O3 (a plane) and GaAs (001) substrates and on thin silicon nitride windows using pulsed laser deposition. Angle-dependent magneto-optic Kerr effect measurements reveal both a uniaxial and a fourfold magnetocrystalline anisotropy for films grown on GaAs (001). X-ray magnetic circular dichroism spectra were measured at the L2,3 edges of the thin films as a function of aluminum cap layer thickness, and transmission mode L2,3 x-ray absorption through a 1000-Å Co2MnSi film grown on a silicon nitride membrane were measured, indicating that deviations from metalliclike spectra are likely due oxidation or contamination. Element-specific moments for Co and Mn were calculated from the X-ray magnetic circular dichroism data of a nonoxidized film.
Stadler, S., Minott, D. H., Harley, D., Craig, J. P., Khan, M., Dubenko, I. I., Ali, N., Story, K., Dvorak, J., Idzerda, Y. U., Arena, D. A. and Harris, V. G. "Element-Specific Magnetic Properties of Co2MnSi Thin Films." (May 2005).