Published in Laknaur, A., Xiao, R., & Wang, H. (2007). A programmable window comparator for analog online testing. 25th IEEE VLSI Test Symmposium (VTS'07), 119-124. doi: 10.1109/VTS.2007.8 ©2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.


This paper discusses the challenge of designing window comparators for analog online testing applications. A programmable window comparator with adaptive error threshold is presented. Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design. Measurement results of the fabricated comparator circuit are also presented.