Published in Laknaur, A., & Wang, H. (2005). Built-in-self-testing techniques for programmable capacitor arrays. Proceedings of the Sixth International Symposium on Quality Electronic Design (ISQED’05), 434-439. doi: 10.1109/ISQED.2005.28 ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.


Programmable capacitor arrays (PCA) are frequently used in reconfigurable analog circuits. Since PCA can be programmed to numerous values, testing PCA by exhaustively examining all PCA values can lead to lengthy testing processes. To address this problem, we present an efficient built-in-self-testing (BIST) method for PCA used in reconfigurable analog circuits. The proposed BIST method takes advantage of existing programmable resources and, hence, introduces very small hardware overhead. Additionally, we present two simple and effective capacitor comparison techniques for implementing the proposed BIST method. The accuracy of the proposed circuit techniques is investigated and closed-form equations are derived for estimating comparison accuracy that can be achieved by the proposed techniques. Finally, circuit simulations are performed to validate the proposed techniques.