Date of Award

1-1-2009

Degree Name

Master of Science

Department

Electrical and Computer Engineering

First Advisor

Dimitri, Kagaris

Abstract

In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant corresponding to the shortest length, is greatly reduced. Experimental results show a significant improvement in run time with practically acceptable test length.

Share

COinS
 

Access

This thesis is only available for download to the SIUC community. Others should
contact the interlibrary loan department of your local library.