Abstract
This paper presents a methodology to perform online self-testing for analog circuits implemented on field-programmable analog arrays (FPAAs). It proposes to partition the FPAA circuit under test into subcircuits. Each subcircuit is tested by replicating the subcircuit with programmable resources on the FPAA chip, and comparing the outputs of the subcircuit and its replication. To effectively implement the proposed methodology, this paper proposes a simple circuit partition method and develops techniques to address circuit stability problems that are often encountered in the proposed testing method. Furthermore, error sources in the proposed testing circuit are studied and methods to improve the accuracy of testing results are presented. Finally, experimental results are presented to demonstrate the validity of the proposed methodology.
Recommended Citation
Laknaur, Amit and Wang, Haibo. "A Methodology to Perform Online Self-Testing for Field-Programmable Analog Array Circuits." (Oct 2005).
Comments
Published in Laknaur, A., & Wang, H. (2005). A methodology to perform online self-testing for field-programmable analog array circuits. IEEE Transactions on Instrumentation and Measurement, 54(5), 1751 - 1760. doi: 10.1109/TIM.2005.855096 ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.